Analyseur d'impédance Modulab XM MTS

Galerie et schémas techniques

Description

Spécifications techniques

Tel

(865) 425-1289 Tel: +44 (0) 1252 556800

Ranges

300 mA to 30 nA options) or 10 μHz to 300kHz

Optique

Spectre couvert 350 nm – 1100 nm, 6 décades d’intensité lumineuse (avec filtre ND), divergence max du faisceau 4° (diamètre max 1 cm), calibration NIST, courant max du LED Driver 10 A, fréquence max du LED Driver (IMPS and IMVS) 250 kHz

Slew Rate

>10 V / μs

Technique

Parameters

Cold White

1000 n/a

Warm White

1000 n/a

Connections

4 (each differential) Signal Output

Slots Taken

1 Wavelength Range 350 nm - 1100 nm

Potentiostat

EIS 1 MHz (via FRA), échantillonnage jusqu’à 1 MS/s, tensions max ±8 V (±100 V en option), courants max ±300 mA (±2 A en option), précisions (lecture% + gamme%) 0.1% +0.05%, Impédance d’entrée >100 GΩ, <28 pF

Cable Shields

Driven / Ground

Specification

Same as RE above Waveform Single Sine, Multisine

Analysis Modes

Single Sine, FFT, Harmonic

DC Measurement

Synchronized to RE Single Sine Sweep Linear / Logarithmic

IR compensation

yes

Input Impedance

>100 GΩ, < 28 pF

Maximum Current

± 300 mA

Accuracy (ratio)

± 0.1%, ± 0.1°

Cell Connections

2, 3 or 4 terminal Intensity Range 6 decades (with ND filter)

LED Options (nm)

Max Power (mA) Bandwidth (FWHM) (nm)

Analysis Channels

RE, WE, Aux A/B/C/D

DC Bias Rejection

Automatic

Input Bias Current

< 10 pA

Maximum Resolution

1.5 pA Frequency Error ± 100 ppm

Maximum Sample Rate

40 MS/s

Maximum Time Record

Unlimited Typical LED Stability at MAX power < 2% drift after 24hrs

Floating Measurements

yes Max Beam Diameter / cell size 1 cm

Smooth Scan Generator

64 MS/s interpolated and filtered LED Driver Max Current 10 A

Instrument Connections

CE, WE, RE, lo Max Beam Divergence 4°

Minimum Pulse Duration

1 μs

Maximum ADC sample rate

1 MS/s Calibration NIST Traceable

Bandwidth (decade steps)

1 MHz to 10 Hz

Charge Extraction Methods

Analyzer for improved signal to noise resolution. In addition, with built

Current Polarization Range

± 300 mA (± 2 A)*

Dye Sensitized Solar Cells

Visible Spectrum - Photoelectrochemistry

Voltage Polarization Range

± 8 V (± 100 V)*

Excellent Thermal Stability

Multi-Sine FFT)

Extraction Techniques , I-V

IMVS Effective Lifetime of Electrons

DC Scan Rate (galvanostatic)

60 kA/s to 200 μA/s IMVS)

Maximum Voltage Measurements

± 8 V

DC Scan Rate (potentiostatic)

1.6 MV/s to 1 μV/s LED Driver Max Frequency (IMPS and 250 kHz

Anti-alias and digital filters

Automatic

Maximum Compliance (Ce. vs LO)

± 8 V

Collimation and Focusing Optics

magnitude of light.

Impedance Measurement Bandwidth

1 MHz (via FRA) Multi-Sine All Frequencies or Selected

NIST Traceable Results Packages

Existing systems can be upgraded to ModuLab XM PhotoEchem

Auxilary Electrodes (A, B, C, D)

urement (single sine, FFT or Harmonic)

Approximate power of each setting

10 - 100 μW per cm

addition of a reference mode. A 50

50 Anti-Reflective Coated

Compliance Voltage Range (floating)

± 8 V Minimum Integration Time per meas- 10 ms

NIST Traceable Calibration of Light Sources

and the reference detector. The response of the cell under test

*Not compatible with Photoelectrochemical card

Analysis Channels

Control and Measure up to 6 decades of Light Intensity

thus eliminating errors associated phase shift and changes in

Accuracy (reading % +range % + offset) 0.1% + 0.05% + 30 fA

Frequency Resolution 1 in 65,000,000

Excellent thermal management of light sources for long term

Circuit

including IMPS, IMVS, Impedance, PhotoVoltage Decay, Charge

IMPS Effective Diffusion Coefficient of Electrons

High Light Intensity Measurements Excellent Thermal Stability

is directly compared with the response of the reference signal

Other systems might experience poor temperature management of

AC Voltammetry

that many users are unfamiliar to many of these techniques and

Auto - Analysis

ModuLab XM PhotoEchem is a fully integrated photoelectrochemical

Enhanced Productivity

sensor inside each detector is supplied with an individual factory

included:

(specifically developed for Solartron ModuLab XM). The NIST traceable

A comprehensive suite of standard electrochemical techniques is

A comprehensive suite of techniques, developed by the leaders in this

the end user. This greatly increases productivity and ease of use.

calibration file. End users can refer all measurements in units of power

Cyclic Voltammetry (Staircase and Linear Sweep)

therefore, at the heart of the product concept is the ability to analyze

Detailed Analysis of DSSC’s Has Never Been Easier

‘Auto’ analysis of data enabled for calculation of effective Diffusion

Photo Voltage Delay Effective Lifetime of Electrons

Applications

• dispositifs photovoltaïques en général et organiques en particulier
• cellules solaires (dont Perovskites et Dssc)
• Quantum dot
• photo électrolyse de l’eau
• photo-batteries
• Toutes caractérisations électrochimiques en général