Station photoélectrochimiques Modulab PhotoEchem

Manufacturer: Solartron analytical
HTTS ref.: HTS-ELEC-0013
HTDS ref.: MODULAB PHOTOECHEM POUR VOS MESURES PHOTOELECTROCH
Division: Électrochimie & Tests

Gallery and technical drawings

Station photoélectrochimiques Modulab PhotoEchem - Image 1

Station photoélectrochimiques Modulab PhotoEchem - Image 2

Description

Basé sur le potentiostat/galvanostat ModuLab XM ECS, l’instrument offre en standard +/- 8V de polarisation et compliance et un courant maximal de +/- 300mA. L’ajout de modules optionnels internes au châssis permet d’atteindre des tensions de +/- 100V et des courants de +/- 2A tout comme de mesurer des très faibles courants jusqu’à une gamme minimale et directe de 3 picoA. Pour plus de courant, des boosters externes optionnels permettent d’atteindre 100A. L’appareil est livré avec un banc optique et une LED 590nm ; d’autres LED de haute intensité sont disponibles en option. L’option IPCE permet la mesure du rendement quantique : elle comprend une source de lumière blanche (350nm-1100nm) et d’un monochromateur offrant une résolution de 10nm. Le logiciel permet de calibrer optiquement (certifiée NIST) les mesures et, ensuite, de lancer toutes ou partie des expériences : IMPS, IMVS, Impedance, Photovoltage Decay, Charge Extraction, I-V. Le logiciel inclue également un volet d’Auto-Analyse menant au calcul automatique du temps de vie des électrons et coefficient de diffusion.

Station de caractérisations photoélectrochimiques ModuLab XM Photoelectrochemical Test System

Key features

Banc optique incluant LED et/ou lumière blanche avec monochromateur (350nm-1100nm)
Techniques clés-en-main : IMVS/IMPS, I-V, PhotoVoltage decay, Charge extraction, impédance et, en option, IPCE (rendement quantique)
Modules optionnels « plug and play », afin de s’adapter à vos besoins
Logiciel XM-studio PhotoEchem inclus, connexion Ethernet

Technical specifications

Tel: (865) 425-1289 Tel: +44 (0) 1252 556800
Ranges: 300 mA to 30 nA options) or 10 μHz to 300kHz
Slew Rate: >10 V / μs
Technique: Parameters
Cold White: 1000 n/a
Warm White: 1000 n/a
Connections: 4 (each differential) Signal Output
Slots Taken: 1 Wavelength Range 350 nm - 1100 nm
Potentiostat: Optics
Cable Shields: Driven / Ground
Specification: Same as RE above Waveform Single Sine, Multisine
Analysis Modes: Single Sine, FFT, Harmonic
DC Measurement: Synchronized to RE Single Sine Sweep Linear / Logarithmic
IR compensation: yes
Input Impedance: >100 GΩ, < 28 pF
Maximum Current: ± 300 mA
Accuracy (ratio): ± 0.1%, ± 0.1°
Cell Connections: 2, 3 or 4 terminal Intensity Range 6 decades (with ND filter)
LED Options (nm): Max Power (mA) Bandwidth (FWHM) (nm)
Analysis Channels: RE, WE, Aux A/B/C/D
DC Bias Rejection: Automatic
Input Bias Current: < 10 pA
Maximum Resolution: 1.5 pA Frequency Error ± 100 ppm
Maximum Sample Rate: 40 MS/s
Maximum Time Record: Unlimited Typical LED Stability at MAX power < 2% drift after 24hrs
Floating Measurements: yes Max Beam Diameter / cell size 1 cm
Smooth Scan Generator: 64 MS/s interpolated and filtered LED Driver Max Current 10 A
Instrument Connections: CE, WE, RE, lo Max Beam Divergence 4°
Minimum Pulse Duration: 1 μs
Maximum ADC sample rate: 1 MS/s Calibration NIST Traceable
Bandwidth (decade steps): 1 MHz to 10 Hz
Charge Extraction Methods: Analyzer for improved signal to noise resolution. In addition, with built
Current Polarization Range: ± 300 mA (± 2 A)*
Dye Sensitized Solar Cells: Visible Spectrum - Photoelectrochemistry
Voltage Polarization Range: ± 8 V (± 100 V)*
Excellent Thermal Stability: Multi-Sine FFT)
Extraction Techniques , I-V: IMVS Effective Lifetime of Electrons
DC Scan Rate (galvanostatic): 60 kA/s to 200 μA/s IMVS)
Maximum Voltage Measurements: ± 8 V
DC Scan Rate (potentiostatic): 1.6 MV/s to 1 μV/s LED Driver Max Frequency (IMPS and 250 kHz
Anti-alias and digital filters: Automatic
Maximum Compliance (Ce. vs LO): ± 8 V
Collimation and Focusing Optics: magnitude of light.
Impedance Measurement Bandwidth: 1 MHz (via FRA) Multi-Sine All Frequencies or Selected
NIST Traceable Results Packages: Existing systems can be upgraded to ModuLab XM PhotoEchem
Auxilary Electrodes (A, B, C, D): urement (single sine, FFT or Harmonic)
Approximate power of each setting: 10 - 100 μW per cm
addition of a reference mode. A 50: 50 Anti-Reflective Coated
Compliance Voltage Range (floating): ± 8 V Minimum Integration Time per meas- 10 ms
NIST Traceable Calibration of Light Sources: and the reference detector. The response of the cell under test
*Not compatible with Photoelectrochemical card: Analysis Channels
Control and Measure up to 6 decades of Light Intensity: thus eliminating errors associated phase shift and changes in
Accuracy (reading % +range % + offset) 0.1% + 0.05% + 30 fA: Frequency Resolution 1 in 65,000,000
Excellent thermal management of light sources for long term: Circuit
including IMPS, IMVS, Impedance, PhotoVoltage Decay, Charge: IMPS Effective Diffusion Coefficient of Electrons
High Light Intensity Measurements Excellent Thermal Stability: is directly compared with the response of the reference signal
Other systems might experience poor temperature management of: AC Voltammetry
that many users are unfamiliar to many of these techniques and: Auto - Analysis
ModuLab XM PhotoEchem is a fully integrated photoelectrochemical: Enhanced Productivity
sensor inside each detector is supplied with an individual factory: included:
(specifically developed for Solartron ModuLab XM). The NIST traceable: A comprehensive suite of standard electrochemical techniques is
A comprehensive suite of techniques, developed by the leaders in this: the end user. This greatly increases productivity and ease of use.
calibration file. End users can refer all measurements in units of power: Cyclic Voltammetry (Staircase and Linear Sweep)
therefore, at the heart of the product concept is the ability to analyze: Detailed Analysis of DSSC’s Has Never Been Easier
‘Auto’ analysis of data enabled for calculation of effective Diffusion: Photo Voltage Delay Effective Lifetime of Electrons